Voigt-function model in diffraction line-broadening analysis

Diffraction-line broadening routes are briefly reviewed. Both laboratory and synchrotron xray measurements of W and MgO showed that a Voigt function satisfactorily fits the physically broadened line profiles. The consequences of an assumed Voigt-function profile shape for both sizebroadened and strain-broadened profiles (“double-Voigt” method) are studied. It is shown that the relationship between parameters obtained by the Warren-Averbach approximation and integralbreadth methods becomes possible. Line-broadening analysis of W and MgO is performed by using the Warren-Averbach and "double-Voigt" approaches and results are compared. To appear in Microstructure Analysis from Diffraction, edited by R. L. Snyder, H. J. Bunge, and J. Fiala, International Union of Crystallography, 1999.